Report Overview

  • Background
    • This report leverages AOI data from TWDMAS (via Spotfire) including all passing and failing sensors
    • Note that only 1 defect bin code is stored per sensor and the data includes any panel or wafer-scrap items
  • Plots
    • Plate Yields by Wafer Lot and Wafer
    • Wafer Maps (Pass/Fail or Failing Defect Modes)
    • Defect Paretos by Wafer Lot

Plate Yields by Wafer Lot and Wafer

Wafer Map - Wafer Lot T211445

Wafer Map - Wafer Lot T214495

Wafer Map - Wafer Lot T214499

Wafer Map - Wafer Lot T211440

Wafer Map - Wafer Lot T214498

Wafer Map - Wafer Lot T214505

Wafer Map - Wafer Lot T211443

Defect Pareto - Wafer Lot T211445

Defect Pareto - Wafer Lot T214495

Defect Pareto - Wafer Lot T214499

Defect Pareto - Wafer Lot T211440

Defect Pareto - Wafer Lot T214498

Defect Pareto - Wafer Lot T214505

Defect Pareto - Wafer Lot T211443